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| 20DL2C41A,20FL2C41A,20GL2C41A TOSHIBA HIGH EFFICIENCY DIODE STACK (HED) SILICON EPITAXIAL TYPE 20DL2C41A,20FL2C41A,20GL2C41A SWITCHING MODE POWER SUPPLY APPLICATIONS CONVERTER & CHOPPER APPLICATION l Repetitive Peak Reverse Voltage l Average Output Rectified Current l Ultra Fast Reverse-Recovery Time : VRRM = 200, 300, 400V : IO = 20A : trr = 35ns (Max) Unit: mm l Low Switching Losses and Output Noise MAXIMUM RATINGS (Ta = 25C) CHARACTERISTIC 20DL2CZ41A Repetitive Peak Reverse Voltage 20FL2CZ41A 20GL2CZ41A Average Output Rectified Current Peak One Cycle Surge Forward Current (Non Repetitive) Junction Temperature Storage Temperature Range Screw Torque IO IFSM Tj Tstg - VRRM SYMBOL RATING 200 300 400 20 100 (50Hz) 110 (60Hz) -40~150 -40~150 0.8 A A C C N*m V UNIT JEDEC JEITA TOSHIBA Weight: 4.85g 2-16D1A POLARITY MARKING 20DL2C *1 MARK 20FL2C 20GL2C TYPE 20DL2C41A 20FL2C41A 20GL2C41A *2 A *3 1 2001-07-09 20DL2C41A,20FL2C41A,20GL2C41A ELECTRICAL CHARACTERISTICS (Ta = 25C) CHARACTERISTIC Peak Forward Voltage (Note 1) 20DL2C41A 20FL2C41A 20GL2C41A (Note 1) (Note 1) (Note 1) IRRM trr tfr Rth (j-c) VRRM = Rated IF = 2.0A, di / dt = - 50A / s IF = 1A DC Total, Junction to Case VFM IFM = 10A SYMBOL TEST CONDITION TYP. MAX 0.98 1.3 1.8 50 35 100 1.5 A ns ns C / W V UNIT Repetitive Peak Reverse Current Reverse Recovery Time Forward Recovery Time Thermal Resistance Note 1: A value of one cell. Note 2: trr TEST CIRCUIT trr WAVEFORM Note 3: tfr TEST CIRCUIT tfr Waveform 2 2001-07-09 20DL2C41A,20FL2C41A,20GL2C41A 3 2001-07-09 20DL2C41A,20FL2C41A,20GL2C41A 4 2001-07-09 20DL2C41A,20FL2C41A,20GL2C41A RESTRICTIONS ON PRODUCT USE 000707EAA * TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the "Handling Guide for Semiconductor Devices," or "TOSHIBA Semiconductor Reliability Handbook" etc.. * The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury ("Unintended Usage"). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in this document shall be made at the customer's own risk. * The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA CORPORATION for any infringements of intellectual property or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any intellectual property or other rights of TOSHIBA CORPORATION or others. * The information contained herein is subject to change without notice. 5 2001-07-09 |
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